@article{article, title = {{Bounded Reordering in the Distributed Test Architecture}}, publisher = {{Institute of Electrical and Electronics Engineers (IEEE)}}, url = {{http://eprints.whiterose.ac.uk/142295/ }}, year = {{2018}}, month = {{6}}, author = {{Hierons RM and Merayo MG and Nunez M}}, doi = {{10.1109/tr.2018.2800093}}, volume = {{67}}, journal = {{IEEE Transactions on Reliability}}, issue = {{2}}, pages = {{522-537}}, note = {{Accessed on 2025/03/13}}}